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To: REH who wrote (12394)	1/5/1999 5:06:00 PM
From: REH	Read Replies (1) \| Respond to of 93625

AEHR TEST SYSTEMS REPORTS SECOND QUARTER RESULTS FOR FISCAL 1999 MOUNTAIN VIEW, Calif., Jan. 5 /PRNewswire/ -- Aehr Test Systems (Nasdaq: AEHR) today reported financial results for the second fiscal quarter and six months ended November 30, 1998. Net sales for the quarter were $5.2 million, a decline of 55.9 percent from net sales of $11.7 million in the same quarter of the prior fiscal year. The net loss for the quarter was $492,000, or $0.07 per share (on 6.9 million shares outstanding), compared with net income of $908,000, or $0.12 per share (on 7.4 million shares outstanding), for the quarter ended November 30, 1997. Net sales for the six month period were $10.6 million, down 54.7 percent from net sales of $23.4 million in the same period of the previous fiscal year. The net loss for the six months was $851,000, or $0.12 per share (on 6.9 million shares outstanding), compared with net income of $1.5 million, or $0.24 per share (on 6.3 million shares outstanding), in the same period a year ago. According to Aehr Test Systems' President Rhea Posedel, the market for the Company's advanced testing and burn-in equipment continues to be affected by the worldwide downturn in the semiconductor industry. "There is still substantial excess capacity for memory device production, and consequently, lower capital spending," said Posedel. "While it is difficult to forecast business levels even one or two quarters in advance, we do expect lower net sales and gross margins in the second half of fiscal 1999 than in the second half of fiscal 1998. We also expect to record a net loss in the third quarter of fiscal 1999. "In this environment, we are focused on staying in close touch with our customers, and on identifying opportunities for new applications, such as the parallel test of Rambus DRAMs. Our goal is to remain at the forefront of the industry from a technology and engineering standpoint, and to be prepared to meet customer needs when the market turns around." During the quarter, Aehr Test introduced the ATX2 Monitored Burn-in System, a cost-effective monitored burn-in solution for high pin-count integrated circuits such as microprocessors and systems-on-a-chip. In addition, the Company began shipping the MAX3 Dynamic Burn-in System, designed for burn-in of digital signal processors, Rambus DRAMs and other devices which require the lower voltage inputs dictated by state-of-the-art processes of 0.25 microns and smaller.