To: REH who wrote (17399 ) 3/16/1999 10:33:00 AM From: REH Read Replies (1) | Respond to of 93625
Viking Components Purchases Latest Test Technology: Advantest's T5591 Enables Viking to Test DDR SDRAM and Rambus RIMM Modules At Speeds Up to 1 GHz RANCHO SANTA MARGARITA, Calif.--(BUSINESS WIRE)--March 16, 1999-- Viking Components, one of the world's largest manufacturers of computer memory, flash and modem products, Tuesday announced the ability to test DDR SDRAM and Rambus RIMM memory modules using the Advantest T5591 platform. The Advantest T5591, the industry's most advanced in-line memory module tester and standard production tester, is easily customized to accommodate varying test requirements of Viking's OEM customers, including major semiconductor and system manufacturers. The advanced testing capability of up to 1 GHz further enhances Viking's ability to support build-to-order memory solutions for premium OEM memory products. ''We are committed to being a leader in providing the highest quality Rambus RIMM modules available. Due to the unique manufacturing requirements and testing specifications of emerging memory architectures like DDR SDRAM and Rambus RIMM modules, the T5591 is an excellent choice for emerging technologies,'' said Shannon Biggs, vice president of manufacturing and engineering, Viking Components. ''Every Viking customer is assured the industry's highest level of quality because Viking tests every module, at-speed, in the system it was designed for, before it leaves our facility. No exceptions.'' ''We are very pleased to be test partners with Viking Components. We are gratified that Viking recognizes the contribution to their product quality that Advantest's T5591 can make, and are confident that their OEM customers will, in turn, be very satisfied with the T5591's test performance and ease of use,'' noted Nicholas Konidaris, president of Advantest America. The Advantest T5591 1 GHz Test System The ultra high-speed T5591 1 GHz test system is aimed at the development and production of advanced RAM devices such as Rambus, PBSRAM, late-write SSRAM and other high-end RAM devices. An unmatched production solution for at-speed testing with complete fault coverage, the T5591 pushes the limits of the emerging 400 MHz synchronous Static and Dynamic RAM products. System capabilities include a hardware Algorithmic Pattern Generator (ALPG) with on-the-fly protocol capability, 100ps skew, and overall timing accuracy (OTA) of +/- 150ps. In addition, the T5591 features a unique conduction cooling system to remove heat from the test head and suppress heat, fan vibration and noise near the device interface, improving both the tester and operator environment.