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Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?

To: kash johal who wrote (62318)	6/18/1999 4:06:00 PM
From: Elmer	Read Replies (2) \| Respond to of 1576592

Re: "1. Reliability- there is a definate correlation between high leakage and MTBF. 2. Overall power consumption goes off scale. 3. Testing issues - static Idd and IDDq testing." I think you are talking about extreme cases. There are processes out there that do not lend themselves to IDDq testing as I stated in a previous post, yet do not have reliability problems. Power consumption goes up like I stated in a previous post but does not go "off the scale". The start of this thread was a discussion of a Pacific Rim fab which claims zero sub-threshold leakage current and I questioned the need to go all the way down to zero. That's all. EP