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Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?


To: Bill Jackson who wrote (82343)12/8/1999 11:00:00 AM
From: Elmer  Read Replies (1) | Respond to of 1578545
 
Re: "Elmer, that must be a versatile test set. Tests wafers, dice and packaged parts de novo with no recourse to prior set parameters(database). I assume it reads the literature and then decides all this."

Bill, there is a published spec for ICC which cannot be exceeded. They measure it and if it exceeds the spec the recourse is the garbage can. You have done a truly masterful job of complicating this beyond all expectations.

EP