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Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?

To: Elmer who wrote (82345)	12/8/1999 11:09:00 AM
From: Bill Jackson	Read Replies (2) \| Respond to of 1578704

Elmer, A DC spec, no clock dependence? I would expect them to test them with a short test like that on wafer and mark them all into a number of virtual bins. Of course some will be disposal stuff and some will need to be further tested. It may be that the ones that take higher currents will end up as lower speed units and vice versa with a number of bins for the parts as they go up the assembly line and get more time and value added and get quantified. The earliest possible recognition of scrap is the best course, but errors in the method could make scrap from good parts(and vice versa). It makes sense to give a final test to the finished boards in the cartridge, but how extensive will that test be? a full load test at max speed will take a long time, so they must take some shortcuts as the time needed to exhaustively test parts may well become excessive? Bill