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Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?

To: Jim McMannis who wrote (86116)	1/9/2000 12:52:00 AM
From: Elmer	Read Replies (1) \| Respond to of 1573924

Re: "I suppose you were talking about Willamena...which we won't see in any volume for another year at least. Surely you're not think of the itanium? Will itanium yields be measured as good die per wafer or good wafers per die? <G>" Actually there is a way to predict yields based on die area where a die-A could be 2x the size of die-B and yield 1/3 the good die as die-B yet they be judged as equivalent yield. It's all based on defect density. PB can explain if he has a mind to. EP