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To: burn2learn who wrote (148658)1/21/2005 2:05:41 PM
From: Elmer PhudRespond to of 275872
 
b2l -

Too many variables. My head is spinning.



To: burn2learn who wrote (148658)1/22/2005 10:20:52 AM
From: combjellyRead Replies (1) | Respond to of 275872
 
"Assume these variables "

Here is another variable you might want to consider.

Cost per wafer is only one part of the cost equation: To obtain a full view of the wafer cost, wafer yield must be taken into account. It is more difficult, however, to determine an accurate estimate of the wafer yield for each manufacturing line. Through a very detailed analysis of both structures, SI has determined that the Intel devices are most likely very sensitive to slight mask misalignments. During the course of a comprehensive construction analysis of the Intel processor that generated several hundred SEM and TEM images, not even slight layer misalignments were found.

Of course, mask misalignments will always be present to some degree; this is certainly evident in other 90-nm devices we have analyzed. The fact that every transistor contact was perfectly aligned in the Intel device tells us that the yield was highly sensitive to slight alignment problems and that wafers with chips exhibiting such problems failed wafer test. Such sensitivity will reduce the wafer yield considerably below the wafer yield achieved by TI.

eetimes.com