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To: Gordon Hodgson who wrote (181277)	5/19/2005 1:56:03 PM
From: Elmer Phud	Read Replies (1) \| Respond to of 186894

For the enlightenment of others, Ali addresses a valid point. Intra-die parametric variations. What he doesn't realize is that it is already factored into the yield numbers because wafer sort tests for far more than just functionality. But it's not worth the trouble of explaining it to him. It would just go over his head anyway...

To: Gordon Hodgson who wrote (181277)	5/19/2005 4:54:34 PM
From: Ali Chen	Read Replies (1) \| Respond to of 186894

Gordon, whoa, ghosts of the past are coming out of dusty closets, long time no see... RE: "It means get off this board! People are getting sick of your stupid name calling and moronic posts." You should be rather sick of some oldtimers who can't keep up with new developments in manufacturing, can't understand new challenges there, and continue to think in terms of 0.35um technology with regard to yields. BTW, this board was pretty dead before earnings report, few messages per day, so could you please go back to your closet and don't interfere when people are talking here. - Ali