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Technology Stocks : Applied Materials No-Politics Thread (AMAT) -- Ignore unavailable to you. Want to Upgrade?

To: Bookdon who wrote (15187)	6/6/2005 8:57:51 AM
From: Fred Levine	Read Replies (1) \| Respond to of 25522

Press Release Source: Applied Materials, Inc. ADVISORY/Applied Materials Announces Breakthrough at Event in New York City Monday June 6, 6:00 am ET NEW YORK--(BUSINESS WIRE)--June 6, 2005--Applied Materials, Inc. (Nasdaq:AMAT - News) What: Applied Materials, Inc. the world's leading supplier of equipment and services to the global semiconductor industry, will announce a significant breakthrough today at an event in New York City. Representatives from the financial and press communities who follow semiconductor equipment, chips and electronic products are invited to attend the event. The presentation will also be webcast at www.appliedmaterials.com. When/Where: Monday, June 6, 4:00 pm (EDT) with reception to follow Location is the W Hotel 201 Park Avenue South, New York City The webcast will be available at 4:00pm (EDT) fred

To: Bookdon who wrote (15187)	6/6/2005 1:14:13 PM
From: Proud_Infidel	Respond to of 25522

"While we are certainly in agreement that the mid-teens growth rates demonstrated through the 80s and most of the 90s are unlikely to reemerge, we also believe that the 'death of tech' as a growth vehicle is vastly overplayed. Message 21390991

To: Bookdon who wrote (15187)	6/7/2005 1:27:09 PM
From: etchmeister	Read Replies (2) \| Respond to of 25522

"The introduction of new materials and processes at the 65-nm technology node has produced new classes of small defects that directly affect fab yield," said Gilad Almogy, vice president and general manager of Applied's Process Diagnostics and Control Group. "The UVision system has proven its value for critical chip layers, such as shallow trench isolation, contact, poly and gate etch, where chip makers have isolated killer defects not found with traditional brightfield tools." This sounds like integrated defect detection; (an etch step is followed by "real time" inspection). I'm not sure to what degree KLAC has integrated their tools into LRCX and NVLS processing tools