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To: William T. Katz who wrote (648)1/9/1998 11:07:00 AM
From: Greg Thornton  Read Replies (1) | Respond to of 1184
 
Bill,

This may be referring to some parametric testing that is done immediately after wafer fabrication on a few test dice per wafer. This testing gives the manufacturer data for process control and tells them whether or not to expect good yield of functional devices on the wafer.

Greg