SI
SI
discoversearch

We've detected that you're using an ad content blocking browser plug-in or feature. Ads provide a critical source of revenue to the continued operation of Silicon Investor.  We ask that you disable ad blocking while on Silicon Investor in the best interests of our community.  If you are not using an ad blocker but are still receiving this message, make sure your browser's tracking protection is set to the 'standard' level.
Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?


To: Tony Viola who wrote (28125)1/26/1998 7:08:00 PM
From: kane  Respond to of 1574680
 
Thank you. I hadn't seen this. I stand corrected.



To: Tony Viola who wrote (28125)1/26/1998 7:59:00 PM
From: Petz  Read Replies (3) | Respond to of 1574680
 
Another thought on CPU testability -- AMD has mastered local interconnect, a technology which allows many more I/O pins on a device with (relatively) low cost. OTOH, Intel has not tried local interconnect yet. Additional I/O's obviously improve the ability to detect faults.

AMD's 4Q conference call also revealed that local interconnect was NOT the reason for low yields.

Petz



To: Tony Viola who wrote (28125)1/26/1998 9:22:00 PM
From: Elmer  Read Replies (1) | Respond to of 1574680
 
Sounds like that J973 is a nice tester but memory manufacturers can't buy top of the line testers for memory devices, the margins are too low. Only the processor manufacturers can afford to buy this expensive iron.

EP