To: Dr. Id who wrote (2028 ) 11/16/1998 10:53:00 AM From: Dr. Id Read Replies (2) | Respond to of 4710
Vitesse Lowers Cost of High Speed Memory Testing With Fanout and Deskew Functions in Single IC CAMARILLO, CALIF. (Nov. 16) BUSINESS WIRE -Nov. 16, 1998--Vitesse Semiconductor Corp. (Nasdaq:VTSS) Monday introduced the VSC6250, a 1Gb/s deskew IC designed for use in automatic test equipment targeted at the Rambus and high speed memory test markets. This fully digital IC incorporates the deskew and fanout functions on a single IC, reducing board space requirements and lowering the cost of automated test equipment (ATE). This integrated circuit performs the fanout of 1 or 2 input signals to 16 outputs and adjusts the delay of those 16 outputs over a range of 5ns with 6ps resolution. The device works for signals up to 1Gb/s and pulse widths as low as 750ps. The VSC6250 may also be used in backplane and clock distribution applications in computers, datacommunications and telecommunications to deskew backplane cables or interconnect at OC-12 (622Mb/s) data rates. "The next generation of Rambus testers must test at-speed at greater than 800Mb/s with better accuracy than that of existing testers. As the Direct Rambus DRAM volume ramps for mainstream PC main memory, cost of test must be lowered dramatically," stated Dr. Jim Gasbarro, test technology manager of the memory technology division at Rambus Inc. "The VSC6250 is the first standard product deskew IC that meets these requirements and enables the use of a low-cost, shared-resource tester architecture for memory test," continued Gasbarro. "Because fanout and deskew ICs with Rambus performance levels, such as the VSC6250, have not been available, ATE manufacturers have simply adapted current logic testers to test Rambus memory devices, with the limitation that only a few devices can be tested in parallel," stated Allan Armstrong, product marketing manager of Vitesse's ATE products division. "With the introduction of the VSC6250, ATE manufacturers can now create testers with a shared resource architecture to dramatically lower cost of test. By producing a system capable of testing up to 64 DUTs in parallel, the depreciation of the tester can be shared among many more devices, enabling lower cost components," concluded Armstrong. The VSC6250 is the latest product in a growing list of standard off-the-shelf solutions developed by Vitesse for use by the ATE equipment market. The device is packaged in a low-cost 128pin PQFP package. It dissipates 5W from a single -2V supply. Samples are available today with production scheduled for December. Pricing is $58 in quantities of 1,000. Vitesse Semiconductor is a world leader in the design, development, manufacturing and marketing of high bandwidth communications and Automatic Test Equipment (ATE) integrated circuits (ICs). The company's products address the needs of telecommunications, datacommunications and ATE equipment manufacturers who demand a combination of high speed, high complexity and low power dissipation. Vitesse corporate headquarters is in Camarillo, with its second fabrication facility in Colorado Springs producing volume supplies of IC. Company/product information can be found on the Web at www.vitesse.com. -0- LES/la* AJE/la CONTACT: Vitesse Semiconductor Patricia Ito, 805/388-3700