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Wednesday September 15, 7:02 am Eastern Time
Company Press Release
SOURCE: Teradyne, Inc.
Teradyne Demonstrates Broad Product Line and Commitment to Fabless And Subcontract Manufacturing Organizations at SEMICON Taiwan
TAIPEI, Taiwan, Sept. 15 /PRNewswire/ -- At SEMICON Taiwan today, Teradyne, Inc. (NYSE: TER - news) showcased its investment in Taiwan and Taiwan's fabless and subcontract manufacturing organizations. Teradyne highlighted its broad product line of automatic test equipment (ATE) for semiconductor development and production. Teradyne's fabless, foundry and subcontractor marketing manager, Sean Kline said that the company's sales in the fabless/subcontract market more than doubled in the 1998 to 1999 timeframe. Teradyne has recently received orders from ASE Test, Advantech Semiconductor, Broadcom, Global Testing Corporation, MediaTek, and OSE. Kline noted that Teradyne has the broadest product line of any ATE manufacturer in the world.
Teradyne's semiconductor test products being demonstrated this week at SEMICON Taiwan include the new INTEGRA J750 VLSI test system, Catalyst system-on-a-chip test system, ARIES High-speed RAM test system and the J973 High-performance VLSI test system. With over 200 of these systems installed at subcontract facilities worldwide, Teradyne has the largest installed base of modern ATE at subcontractors in the industry.
About the J750
The INTEGRA J750 delivers up to 1,024 digital channels into a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities help deliver 95% parallel test efficiency for up to 32 devices. The system also features IG-XL test software, the semiconductor ATE industry's first test development suite combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic. Its small footprint and high parallel test throughput provides the most economical approach to testing complex VLSI devices with embedded memory and analog cells.
About Catalyst
Catalyst is the leading system-on-a-chip (SOC) test system with hundreds installed worldwide and the fastest growing installed base among leading fabless and subcontract test companies. Catalyst is being used today by all major semiconductor manufacturers to test the most advanced chips, including graphics controllers and other multimedia devices such as DVD and MPEG controllers, as well as core logic devices, wireless, Internet ICs, and mass storage devices. Having pioneered parallel test with quad site testing capabilities for disk drive and networking device testing, Catalyst provides the most complete range of high performance instrumentation needed for SOC testing today. Catalyst instrumentation offered includes: MicroWAVE6000(TM) instrumentation suite; PicoClock(TM), an ultra low jitter clock; AWG2400 10-bit Waveform Generator, the highest performance waveform generator available in the ATE industry; 1 Gigahertz Digitizer; as well as VX software, a suite of design-to-test simulation tools.
About ARIES
The ARIES High Speed Memory test system, with its FlexSystem architecture that integrates high performance logic and algorithmic memory pattern generation, provides the highest fault coverage and throughput for Direct Rambus memory test. The ARIES demonstration will focus on Direct Rambus production test at-speed RIMM module testing. The presentation will highlight actual testing results that show ARIES correlates with the characterization reference system at Rambus, provides world class repeatability for high yield in production, and delivers an unrivaled test time advantage of up to 10:1 for standard MOAV pattern testing of Direct Rambus devices. ``Benchmarks have shown that ARIES provides the shortest test time for Direct Rambus production test,' said Glenn Farris, ARIES Product Manager. ``Combined with production-ready 16-in-parallel test capability, ARIES delivers the highest throughput and lowest cost for Direct Rambus production test available today.
About the J973
The J973 VLSI test system demonstrated it's new VHF Digitizer Option. The J973 VHF Digitizer Option (VDO) provides the necessary capabilities for full characterization and single pass production testing of integrated graphics and core logic devices. According to Gordon Borneman, J973 Product Manager, ``Today's integrated graphics and logic devices require the speed and accuracy of a high-performance VLSI test system in order to test their high-speed bus interfaces like AGP4x, Rambus, and DDR SDRAM. They also require integrated instrumentation to test embedded graphics and video (DACs). The J973 with VHF Digitizer Option is ideally suited to the task.' With the addition of the VDO option to the J973's high performance digital, advanced memory and broad scan capabilities, the J973 provides a full range of test capabilities to test high-performance VLSI devices.
About Teradyne
Teradyne (NYSE: TER - news) is the world's largest manufacturer of automatic test equipment (ATE) for the electronics industry. Products include systems to test semiconductor devices, printed circuit assemblies, telephone lines, computerized telephone systems, internet and intranet networks, and software. The company is also a leading supplier of high-performance connection systems used in the manufacture of electronics. Teradyne's extensive service network supports customers through a worldwide service and application engineering network, with technical centers located throughout Asia, Europe and North America. Headquartered in Boston, Massachusetts, Teradyne reported sales of approximately $1.5 billion in 1998 and has approximately 7,000 employees worldwide. The company's Web address is teradyne.com.
SOURCE: Teradyne, Inc.
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